JPH0468535U - - Google Patents
Info
- Publication number
- JPH0468535U JPH0468535U JP11150690U JP11150690U JPH0468535U JP H0468535 U JPH0468535 U JP H0468535U JP 11150690 U JP11150690 U JP 11150690U JP 11150690 U JP11150690 U JP 11150690U JP H0468535 U JPH0468535 U JP H0468535U
- Authority
- JP
- Japan
- Prior art keywords
- light
- lead
- tip
- leads
- optical axis
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005452 bending Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11150690U JPH0468535U (en]) | 1990-10-24 | 1990-10-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11150690U JPH0468535U (en]) | 1990-10-24 | 1990-10-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0468535U true JPH0468535U (en]) | 1992-06-17 |
Family
ID=31858968
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11150690U Pending JPH0468535U (en]) | 1990-10-24 | 1990-10-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0468535U (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100510474B1 (ko) * | 1998-07-13 | 2005-10-25 | 삼성전자주식회사 | 집적 회로 패키지의 리드 검사장비 및 그 검사방법 |
-
1990
- 1990-10-24 JP JP11150690U patent/JPH0468535U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100510474B1 (ko) * | 1998-07-13 | 2005-10-25 | 삼성전자주식회사 | 집적 회로 패키지의 리드 검사장비 및 그 검사방법 |